High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip
High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip by Zheng Wang, Anupam Chattopadhyay
English | 2018 | ISBN: 9811010722 | 197 Pages | PDF | 29.6 MB
English | 2018 | ISBN: 9811010722 | 197 Pages | PDF | 29.6 MB
This book introduces a novel framework for accurately modeling the errors in nanoscale CMOS technology and developing a smooth tool flow at high-level design abstractions to estimate and mitigate the effects of errors. The book presents novel techniques for high-level fault simulation and reliability estimation as well as architecture-level and system-level fault tolerant designs. It also presents a survey of state-of-the-art problems and solutions, offering insights into reliability issues in digital design and their cross-layer countermeasures.