Advanced Characterization Techniques for Thin Film Solar Cells
Advanced Characterization Techniques for Thin Film Solar Cells
Wiley-VCH | Solid State Physics | Oct. 10 2016 | ISBN-10: 3527339922 | 760 pages | pdf | 23.4 mb
Wiley-VCH | Solid State Physics | Oct. 10 2016 | ISBN-10: 3527339922 | 760 pages | pdf | 23.4 mb
by Daniel Abou-Ras (Editor), Thomas Kirchartz (Editor), Uwe Rau (Editor)
The book focuses on advanced characterization methods for thin-film solar cells that have proven their relevance both for academic and corporate photovoltaic research and development. After an introduction to thin-film photovoltaics, highly experienced experts report on device and materials characterization methods such as electroluminescence analysis, capacitance spectroscopy, and various microscopy methods. In the final part of the book simulation techniques are presented which are used for ab-initio calculations of relevant semiconductors and for device simulations in 1D, 2D and 3D.
Building on a proven concept, this new edition also covers thermography, transient optoelectronic methods, and absorption and photocurrent spectroscopy.
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